4299 search results - page 74 / 860 » Concurrent Test Generation |
131
Voted
ICSE
2009
IEEE-ACM
15 years 7 days ago
2009
IEEE-ACM
Software security issues have been a major concern to the cyberspace community, so a great deal of research on security testing has been performed, and various security testing te...
143
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IOLTS
2005
IEEE
15 years 8 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
112
Voted
DATE
2000
IEEE
15 years 7 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
141
Voted
CORR
2010
Springer
2010
Springer
Reliable Mining of Automatically Generated Test Cases from Software Requirements Specification (SRS)
15 years 2 months ago
Writing requirements is a two-way process. In this paper we use to classify Functional Requirements (FR) and Non Functional Requirements (NFR) statements from Software Requirement...
101
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ICSE
2007
IEEE-ACM
16 years 2 months ago
2007
IEEE-ACM
This paper describes the Korat tool for constraint-based generation of structurally complex test inputs for Java programs. Korat takes (1) an imperative predicate that specifies t...