4299 search results - page 9 / 860 » Concurrent Test Generation |
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any ...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low powe...
SIGSOFT
2004
ACM
14 years 23 days ago
2004
ACM
In run-time safety analysis the executions of a concurrent program are monitored and analyzed with respect to safety properties. Similar to testing, run-time analysis is quite eï¬...
PASTE
2010
ACM
14 years 13 days ago
2010
ACM
Multicore is now the dominant processor trend, and the number of cores is rapidly increasing. The paradigm shift to multicore forces the redesign of the software stack, which incl...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...