Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
The amplitude of coupled noise is often used in estimating the crosstalk effect. Coupling noise-induced delay measures the impact of crosstalk on circuit performance. Efficient c...
Guarded evaluation is a power reduction technique that involves identifying sub-circuits (within a larger circuit) whose inputs can be held constant (guarded) at specific times d...