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MEMOCODE
2007
IEEE
14 years 1 months ago
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
Stephan Eggersglüß, Görschwin Fey,...
DATE
2008
IEEE
106views Hardware» more  DATE 2008»
14 years 2 months ago
Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
Anshuman Chandra, Felix Ng, Rohit Kapur
ICCAD
1997
IEEE
137views Hardware» more  ICCAD 1997»
13 years 11 months ago
Optimization techniques for high-performance digital circuits
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
Chandramouli Visweswariah
ISQED
2003
IEEE
102views Hardware» more  ISQED 2003»
14 years 24 days ago
Modeling Crosstalk Induced Delay
The amplitude of coupled noise is often used in estimating the crosstalk effect. Coupling noise-induced delay measures the impact of crosstalk on circuit performance. Efficient c...
Chung-Kuan Tsai, Malgorzata Marek-Sadowska
FPGA
2010
ACM
209views FPGA» more  FPGA 2010»
14 years 4 months ago
FPGA power reduction by guarded evaluation
Guarded evaluation is a power reduction technique that involves identifying sub-circuits (within a larger circuit) whose inputs can be held constant (guarded) at specific times d...
Chirag Ravishankar, Jason Helge Anderson