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» Convolutional Compaction of Test Responses
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ICCAD
1994
IEEE
59views Hardware» more  ICCAD 1994»
13 years 11 months ago
Fault dictionary compaction by output sequence removal
Fault dictionary compaction has been accomplished in the past by removing responses on individual output pins for speci c test vectors. In contrast to the previous work, we presen...
Vamsi Boppana, W. Kent Fuchs
ATS
2002
IEEE
110views Hardware» more  ATS 2002»
14 years 14 days ago
Test Requirement Analysis for Low Cost Hierarchical Test Path Construction
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
Yiorgos Makris, Alex Orailoglu
DELTA
2008
IEEE
14 years 2 months ago
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
VTS
1995
IEEE
99views Hardware» more  VTS 1995»
13 years 11 months ago
Arithmetic built-in self test for high-level synthesis
In this paper, we propose an entirely new Built-In Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to...
Nilanjan Mukherjee, H. Kassab, Janusz Rajski, Jerz...
SIGGRAPH
2010
ACM
13 years 12 months ago
Precomputed wave simulation for real-time sound propagation of dynamic sources in complex scenes
We present a method for real-time sound propagation that captures all wave effects, including diffraction and reverberation, for multiple moving sources and a moving listener in a...
Nikunj Raghuvanshi, John Snyder, Ravish Mehra, Min...