1944 search results - page 11 / 389 » Coupling-based Integration Testing |
ICCD
2003
IEEE
14 years 23 days ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
MBEES
2010
13 years 5 months ago
2010
In a component-based development approach system integration generally implies the packaging and deployment of a group of software components on hardware units, possibly hiding th...
DATE
2003
IEEE
14 years 24 days ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
DATE
2003
IEEE
14 years 24 days ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...