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DAC
2003
ACM
14 years 28 days ago
Test application time and volume compression through seed overlapping
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu
ISSRE
2002
IEEE
14 years 18 days ago
Test Reuse in the Spreadsheet Paradigm
Spreadsheet languages are widely used by a variety of end users to perform many important tasks. Despite their perceived simplicity, spreadsheets often contain faults. Furthermore...
Marc Fisher II, Dalai Jin, Gregg Rothermel, Margar...
GECCO
2010
Springer
163views Optimization» more  GECCO 2010»
13 years 11 months ago
Factors affecting the use of genetic algorithms in test suite augmentation
Test suite augmentation techniques are used in regression testing to help engineers identify code elements affected by changes, and generate test cases to cover those elements. R...
Zhihong Xu, Myra B. Cohen, Gregg Rothermel
DAC
2008
ACM
14 years 8 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
14 years 1 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...