The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, ...
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
The existing TCP (Transmission Control Protocol) is known to be unsuitable for a network with the characteristics of high BDP (Bandwidth-Delay Product) because of the fixed small o...
Gi-chul Yoo, Eun-sook Sim, Dongkyun Kim, Taeyoung ...