Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Ome...
Large-scale data analysis has become increasingly important for many enterprises. Recently, a new distributed computing paradigm, called MapReduce, and its open source implementat...
The number of functional errors escaping design verification and being released into final silicon is growing, due to the increasing complexity and shrinking production schedules ...
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott ...