State-of-the-art automatic reliability analyses as used in system-level design approaches mainly rely on Binary Decision Diagrams (BDDs) and, thus, face two serious problems: (1) ...
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
— In many verification tools methods for functional simulation based on reduced ordered Binary Decision Diagrams (BDDs) are used. The evaluation time for a BDD can be crucial an...
Abstract. Refutation proofs can be viewed as a special case of constraint propagation, which is a fundamental technique in solving constraint-satisfaction problems. The generalizat...
Albert Atserias, Phokion G. Kolaitis, Moshe Y. Var...
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
Zhihong Zeng, Qiushuang Zhang, Ian G. Harris, Maci...