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DAC
2010
ACM
14 years 1 months ago
Towards scalable system-level reliability analysis
State-of-the-art automatic reliability analyses as used in system-level design approaches mainly rely on Binary Decision Diagrams (BDDs) and, thus, face two serious problems: (1) ...
Michael Glaß, Martin Lukasiewycz, Christian ...
ISQED
2006
IEEE
155views Hardware» more  ISQED 2006»
14 years 3 months ago
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
Bin Zhang, Wei-Shen Wang, Michael Orshansky
ASPDAC
2004
ACM
107views Hardware» more  ASPDAC 2004»
14 years 3 months ago
Minimization of the expected path length in BDDs based on local changes
— In many verification tools methods for functional simulation based on reduced ordered Binary Decision Diagrams (BDDs) are used. The evaluation time for a BDD can be crucial an...
Rüdiger Ebendt, Wolfgang Günther, Rolf D...
CP
2004
Springer
14 years 3 months ago
Constraint Propagation as a Proof System
Abstract. Refutation proofs can be viewed as a special case of constraint propagation, which is a fundamental technique in solving constraint-satisfaction problems. The generalizat...
Albert Atserias, Phokion G. Kolaitis, Moshe Y. Var...
DATE
2003
IEEE
99views Hardware» more  DATE 2003»
14 years 3 months ago
Fast Computation of Data Correlation Using BDDs
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
Zhihong Zeng, Qiushuang Zhang, Ian G. Harris, Maci...