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DAC
2010
ACM
15 years 8 months ago
Towards scalable system-level reliability analysis
State-of-the-art automatic reliability analyses as used in system-level design approaches mainly rely on Binary Decision Diagrams (BDDs) and, thus, face two serious problems: (1) ...
Michael Glaß, Martin Lukasiewycz, Christian ...
ISQED
2006
IEEE
155views Hardware» more  ISQED 2006»
15 years 11 months ago
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
Bin Zhang, Wei-Shen Wang, Michael Orshansky
ASPDAC
2004
ACM
107views Hardware» more  ASPDAC 2004»
15 years 10 months ago
Minimization of the expected path length in BDDs based on local changes
— In many verification tools methods for functional simulation based on reduced ordered Binary Decision Diagrams (BDDs) are used. The evaluation time for a BDD can be crucial an...
Rüdiger Ebendt, Wolfgang Günther, Rolf D...
CP
2004
Springer
15 years 10 months ago
Constraint Propagation as a Proof System
Abstract. Refutation proofs can be viewed as a special case of constraint propagation, which is a fundamental technique in solving constraint-satisfaction problems. The generalizat...
Albert Atserias, Phokion G. Kolaitis, Moshe Y. Var...
DATE
2003
IEEE
99views Hardware» more  DATE 2003»
15 years 10 months ago
Fast Computation of Data Correlation Using BDDs
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
Zhihong Zeng, Qiushuang Zhang, Ian G. Harris, Maci...