25 search results - page 1 / 5 » DFFT : Design For Functional Testability |
ITC
2003
IEEE
14 years 29 days ago
2003
IEEE
Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC ...
ISQED
2007
IEEE
14 years 2 months ago
2007
IEEE
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
CORR
2010
Springer
13 years 6 months ago
2010
Springer
: We initiate the study of property testing of submodularity on the boolean hypercube. Submodular functions come up in a variety of applications in combinatorial optimization. For ...
DATE
2002
IEEE
14 years 20 days ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...