34 search results - page 4 / 7 » Deductive Fault Simulation for Asynchronous Sequential Circu... |
ICCAD
1998
IEEE
14 years 24 days ago
1998
IEEE
We present a fast, dynamic fault coverage estimation technique for sequential circuits that achieves high degrees of accuracy by signi cantly reducing the number of injected fault...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
1 The first path implicit and exact non–robust path delay fault grading technique for non–scan sequential circuits is presented. Non enumerative exact coverage is obtained, b...
VLSID
1997
IEEE
14 years 22 days ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ICCAD
1997
IEEE
14 years 23 days ago
1997
IEEE
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...