34 search results - page 6 / 7 » Deductive Fault Simulation for Asynchronous Sequential Circu... |
DATE
2007
IEEE
14 years 4 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
CHARME
1995
Springer
14 years 1 months ago
1995
Springer
In this paper we present a method formodeling asynchronous digital circuits by timed automata. The constructed timed automata serve as \mechanical" and veri able objects for a...
CF
2004
ACM
14 years 3 months ago
2004
ACM
This paper presents a fault tolerant design technique for the clockless wave pipeline. The specific architectural model investigated in this paper is the two-phase clockless asyn...
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
ICCAD
1995
IEEE
14 years 1 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...