Technology scaling allows the integration of billions of transistors on the same die but CAD tools struggle in keeping up with the increasing design complexity. Design productivit...
CT The traditional approach to worst-case static-timing analysis is becoming unacceptably conservative due to an ever-increasing number of circuit and process effects. We propose a...
With the increasing popularity of COTS (commercial off the shelf) components and multi-core processor in space and aviation applications, software fault tolerance becomes attracti...
– There has been a recent shift in design paradigms, with many turning towards yield-driven approaches to synthesize and design systems. A major cause of this shift is the contin...
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...