109 search results - page 3 / 22 » Design Methodology and Manufacture of a Microinductor |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
HIS
2009
13 years 5 months ago
2009
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
ICCD
2005
IEEE
14 years 4 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
WSC
2001
13 years 8 months ago
2001
Semiconductor manufacturing is generally considered a cyclic industry. As such, individual producers able to react quickly and appropriately to market conditions will have a compe...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Variability of circuit performance is becoming a very important issue for ultra-deep sub-micron technology. Gate length variation has the most direct impact on circuit performance...