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» Design Methodology and Manufacture of a Microinductor
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WCE
2007
13 years 8 months ago
Manufacturing industries need Design of Experiments (DoE)
— Although experimentation is a frequent activity of engineers, they usually use primitive strategies to carry on their experiments. A survey identifies the needs of using an eff...
Martín Tanco, Elisabeth Viles, Laura Ilzarb...
ITC
1998
IEEE
95views Hardware» more  ITC 1998»
13 years 11 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
DAC
2000
ACM
14 years 8 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
ICMAS
1998
13 years 8 months ago
Agent-Oriented Programming of Manufacturing Control Tasks
The success of agent-oriented concepts in various application domains, in particular in manufacturing control, creates the need for an agent-oriented analysis, design, and program...
Stefan Bussmann
FCCM
2006
IEEE
106views VLSI» more  FCCM 2006»
14 years 1 months ago
Defect-Tolerant Nanocomputing Using Bloom Filters
We propose a novel defect-tolerant design methodology using Bloom filters for defect mapping for nanoscale computing devices. It is a general approach that can be used for any pe...
Gang Wang, Wenrui Gong, Ryan Kastner