It was shown in the past that ATPG based on the Boolean Satisfiability problem is a beneficial complement to traditional ATPG techniques. Its advantages can be observed especially ...
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
This paper develops a novel approach for formally verifying both safety and liveness properties of designs using sequential ATPG tools. The properties are automatically mapped int...
Jacob A. Abraham, Vivekananda M. Vedula, Daniel G....
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...