In this paper, we investigate methods for improving the hit rates in the first level of memory hierarchy. Particularly, we propose victim cache structures to reduce the number of ...
Gokhan Memik, Glenn Reinman, William H. Mangione-S...
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
Increased integration in the form of multiple processor cores on a single die, relatively constant die sizes, shrinking power envelopes, and emerging applications create a new cha...
Srikanth T. Srinivasan, Ravi Rajwar, Haitham Akkar...
— Device scaling and large integration increase the vulnerability of microprocessors to transient errors. One of the structures where errors can be most harmful is the register ï...
This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory. Te...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...