49 search results - page 4 / 10 » Design fault directed test generation for microprocessor val... |
TC
1998
13 years 7 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
MTV
2005
IEEE
14 years 1 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...