Planning agents often lack the computational resources needed to build full planning trees for their environments. Agent designers commonly overcome this finite-horizon approxima...
Jonathan Sorg, Satinder P. Singh, Richard L. Lewis
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
A stochastic global optimization approach is presented for transistor sizing in CMOS VLSI circuits. This is a direct search strategy for the best design among feasible ones, with ...