88 search results - page 7 / 18 » Design for manufacturability in submicron domain |
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Increasing complexity of the functionalities and the resultant growth in number of gates integrated in a chip coupled with shrinking geometries and short cycle time requirements br...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
HIS
2009
13 years 5 months ago
2009
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
ISPD
2005
ACM
14 years 1 months ago
2005
ACM
The sustained progress of VLSI technology has altered the landscape of routing which is a major physical design stage. For timing driven routings, traditional approaches which con...
DAC
2004
ACM
14 years 29 days ago
2004
ACM
As the technology migrates into the deep submicron manufacturing (DSM) era, the critical dimension of the circuits is getting smaller than the lithographic wavelength. The unavoid...