54 search results - page 7 / 11 » Designing Leakage Aware Multipliers |
GLVLSI
2009
IEEE
13 years 10 months ago
2009
IEEE
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
VLSID
2009
IEEE
14 years 7 months ago
2009
IEEE
Power density has been increasing at an alarming rate in recent processor generations resulting in high on-chip temperature. Higher temperature results in poor reliability and inc...
ISLPED
2009
ACM
14 years 1 months ago
2009
ACM
Post-fabrication tuning for mitigating manufacturing variability is receiving a significant attention. To reduce leakage increase involved in performance compensation by body bia...
DSD
2009
IEEE
14 years 1 months ago
2009
IEEE
— 3D stacked architectures provide significant benefits in performance, footprint and yield. However, vertical stacking increases the thermal resistances, and exacerbates tempe...
MICRO
2006
IEEE
14 years 21 days ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...