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DATE
2010
IEEE
14 years 17 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
FPGA
2004
ACM
13 years 11 months ago
2004
ACM
Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice of platform for the implementation of cryptographic systems. Until recently, designers using FPGAs had le...
FPL
2004
Springer
14 years 26 days ago
2004
Springer
In order to enable efficient integration of FPGAs into cost effective and reliable high-performance systems as well potentially into low power mobile systems, their power efficienc...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...