49 search results - page 7 / 10 » Designing logic circuits for probabilistic computation in th... |
DAC
1996
ACM
13 years 11 months ago
1996
ACM
Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...
NC
2008
13 years 7 months ago
2008
A highly desired part of the synthetic biology toolbox is an embedded chemical microcontroller, capable of autonomously following a logic program specified by a set of instructions...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
ASYNC
2000
IEEE
13 years 12 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...