VLSI timing analysis and power estimation target the same circuit switching activity. Power estimation techniques are categorized as (1) static, (2) statistical, and (3) simulatio...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
Biological systems are traditionally studied by focusing on a specific subsystem, building an intuitive model for it, and refining the model using results from carefully designed ...
Irit Gat-Viks, Amos Tanay, Daniela Raijman, Ron Sh...
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
Hamed F. Dadgour, Rajiv V. Joshi, Kaustav Banerjee