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DAC
2001
ACM
14 years 8 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
CISSE
2008
Springer
13 years 9 months ago
Using B-trees to Implement Water: a Portable, High Performance, High-Level Language
- To achieve high performance, the next generation of high-level programming languages should incorporate databases as core technology. Presented here are the design considerations...
Aubrey Jaffer, Mike Plusch, Robert Nilsson
DATE
2005
IEEE
94views Hardware» more  DATE 2005»
14 years 1 months ago
Meeting the Embedded Design Needs of Automotive Applications
The importance of embedded systems in driving innovation in automotive applications continues to grow. Understanding the specific needs of developers targeting this market is also...
Wayne Lyons
VTS
2007
IEEE
103views Hardware» more  VTS 2007»
14 years 2 months ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
DSN
2007
IEEE
14 years 2 months ago
Using Process-Level Redundancy to Exploit Multiple Cores for Transient Fault Tolerance
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
Alex Shye, Tipp Moseley, Vijay Janapa Reddi, Josep...