434 search results - page 29 / 87 » Detection and correction of design defects in object-oriente... |
ISCA
2009
IEEE
14 years 2 months ago
2009
IEEE
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
ISCA
2011
IEEE
12 years 11 months ago
2011
IEEE
Due to shrinking feature sizes processors are becoming more vulnerable to soft errors. Write-back caches are particularly vulnerable since they hold dirty data that do not exist i...
TCBB
2011
13 years 2 months ago
2011
— Probe defects are a major source of noise in gene expression studies. While existing approaches detect noisy probes based on external information such as genomic alignments, we...
ACSD
2004
IEEE
13 years 11 months ago
2004
IEEE
The design productivity gap has been recognized by the semiconductor industry as one of the major threats to the continued growth of system-on-chips and embedded systems. Ad-hoc s...