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KBSE
2006
IEEE
14 years 1 months ago
Automatic Generation of Detection Algorithms for Design Defects
Maintenance is recognised as the most difficult and expansive activity of the software development process. Numerous techniques and processes have been proposed to ease the mainte...
Naouel Moha, Yann-Gaël Guéhéneu...
DATE
2005
IEEE
104views Hardware» more  DATE 2005»
14 years 1 months ago
Defect Aware Test Patterns
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen W...
JSS
2000
85views more  JSS 2000»
13 years 7 months ago
An experimental comparison of reading techniques for defect detection in UML design documents
The basic motivation for software inspections is to detect and remove defects before they propagate to subsequent development phases where their detection and removal becomes more...
Oliver Laitenberger, Colin Atkinson, Maud Schlich,...
DFT
2007
IEEE
141views VLSI» more  DFT 2007»
14 years 1 months ago
A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Gl...
DATE
2000
IEEE
83views Hardware» more  DATE 2000»
13 years 12 months ago
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects
Delay defects on I/O pads, interconnections of a board, or interconnections among embedded cores can not be tested with the current IEEE 1149.1 boundary scan design. This paper in...
Sungju Park, Taehyung Kim