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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 8 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
HPCA
2008
IEEE
14 years 8 months ago
Supporting highly-decoupled thread-level redundancy for parallel programs
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
M. Wasiur Rashid, Michael C. Huang
HPCA
2005
IEEE
14 years 8 months ago
Tapping ZettaRAMTM for Low-Power Memory Systems
ZettaRAMTM is a new memory technology under development by ZettaCoreTM as a potential replacement for conventional DRAM. The key innovation is replacing the conventional capacitor...
Ravi K. Venkatesan, Ahmed S. Al-Zawawi, Eric Roten...
POPL
2003
ACM
14 years 8 months ago
From symptom to cause: localizing errors in counterexample traces
There is significant room for improving users' experiences with model checking tools. An error trace produced by a model checker can be lengthy and is indicative of a symptom...
Thomas Ball, Mayur Naik, Sriram K. Rajamani
MOBIHOC
2005
ACM
14 years 7 months ago
Low-coordination topologies for redundancy in sensor networks
Tiny, low-cost sensor devices are expected to be failure-prone and hence in many realistic deployment scenarios for sensor networks these nodes are deployed in higher than necessa...
Rajagopal Iyengar, Koushik Kar, Suman Banerjee