With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
ZettaRAMTM is a new memory technology under development by ZettaCoreTM as a potential replacement for conventional DRAM. The key innovation is replacing the conventional capacitor...
Ravi K. Venkatesan, Ahmed S. Al-Zawawi, Eric Roten...
There is significant room for improving users' experiences with model checking tools. An error trace produced by a model checker can be lengthy and is indicative of a symptom...
Tiny, low-cost sensor devices are expected to be failure-prone and hence in many realistic deployment scenarios for sensor networks these nodes are deployed in higher than necessa...