93 search results - page 12 / 19 » Diagnosis of Delay Defects Using Statistical Timing Models |
SAC
2006
ACM
14 years 1 months ago
2006
ACM
: In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
FPGA
2007
ACM
14 years 1 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
9, IO]. However, unlike the case with static timing, it is not so easy We show how recent advances in the handling of correlated interval representations of range uncertainty can b...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...