93 search results - page 3 / 19 » Diagnosis of Delay Defects Using Statistical Timing Models |
ITC
2003
IEEE
14 years 18 days ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...