45 search results - page 5 / 9 » Diagonal Circuit Identity Testing and Lower Bounds |
STOC
2010
ACM
14 years 5 months ago
2010
ACM
We initiate a direction for proving lower bounds on the size of non-commutative arithmetic circuits. This direction is based on a connection between lower bounds on the size of no...
ICCAD
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
STOC
1998
ACM
13 years 12 months ago
1998
ACM
We present a Monte Carlo algorithm for testing multivariate polynomial identities over any field using fewer random bits than other methods. To test if a polynomial P(x1 ::: xn) ...
ECCC
2010
13 years 6 months ago
2010
We study the problem of testing isomorphism (equivalence up to relabelling of the variables) of two Boolean functions f, g : {0, 1}n → {0, 1}. Our main focus is on the most stud...