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MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
Shrinking transistor sizes and a trend toward low-power processors have caused increased leakage, high per-device variation and a larger number of hard and soft errors. Maintainin...
FOCS
2007
IEEE
14 years 2 months ago
2007
IEEE
d Abstract) Kousha Etessami LFCS, School of Informatics University of Edinburgh Mihalis Yannakakis Department of Computer Science Columbia University We reexamine what it means to...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Despite the progress of the last decades in electronic design automation, arithmetic circuits have always received way less attention than other classes of digital circuits. Logic...
CASES
2007
ACM
2007
ACM
INTACTE: an interconnect area, delay, and energy estimation tool for microarchitectural explorations
13 years 11 months ago
Prior work on modeling interconnects has focused on optimizing the wire and repeater design for trading off energy and delay, and is largely based on low level circuit parameters....