787 search results - page 129 / 158 » Digital Algebra and Circuits |
DAC
2003
ACM
14 years 8 months ago
2003
ACM
We present an algorithm that checks behavioral consistency between an ANSI-C program and a circuit given in Verilog using Bounded Model Checking. Both the circuit and the program ...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Parametric representations used for symbolic simulation of circuits usually use BDDs. After a few steps of symbolic simulation, state set representation is converted from one para...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Title of thesis: EFFICIENT AND ACCURATE STATISTICAL TIMING ANALYSIS FOR NON-LINEAR NON-GAUSSIAN VARIABILITY WITH INCREMENTAL ATTRIBUTES Ashish Dobhal, Master of Science, 2006 Thes...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ISPD
2010
ACM
14 years 2 months ago
2010
ACM
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...