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DSD
2005
IEEE
75views Hardware» more  DSD 2005»
14 years 2 months ago
An Educational Environment for Digital Testing: Hardware, Tools, and Web-Based Runtime Platform
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...
Artur Jutman, Jaan Raik, Raimund Ubar, V. Vislogub...
ASPDAC
2004
ACM
141views Hardware» more  ASPDAC 2004»
14 years 2 months ago
An approach for reducing dynamic power consumption in synchronous sequential digital designs
— The problem of minimizing dynamic power consumption by scaling down the supply voltage of computational elements off critical paths is widely addressed in the literature for th...
Noureddine Chabini, Wayne Wolf
DATE
2010
IEEE
171views Hardware» more  DATE 2010»
14 years 2 months ago
Digital statistical analysis using VHDL
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Manfred Dietrich, Uwe Eichler, Joachim Haase
DAC
2006
ACM
14 years 3 months ago
Automated design of pin-constrained digital microfluidic arrays for lab-on-a-chip applications*
Microfluidics-based biochips, also referred to as lab-on-a-chip (LoC), are devices that integrate fluid-handling functions such as sample preparation, analysis, separation, and de...
William L. Hwang, Fei Su, Krishnendu Chakrabarty
CASES
2009
ACM
14 years 1 months ago
Exploiting residue number system for power-efficient digital signal processing in embedded processors
2's complement number system imposes a fundamental limitation on the power and performance of arithmetic circuits, due to the fundamental need of cross-datapath carry propaga...
Rooju Chokshi, Krzysztof S. Berezowski, Aviral Shr...