With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...
— While physically driven synthesis techniques have proven to be an effective method to meet tight timing constraints required by a design, the incremental placement step during ...
Andrew C. Ling, Deshanand P. Singh, Stephen Dean B...
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
In this paper, we obtain the lower bounds on total energy dissipation of deep submicron (DSM) VLSI circuits via an informationtheoretic framework. This framework enables the deriv...