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» Domain Reduction for the Circuit Constraint
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GLVLSI
2008
IEEE
128views VLSI» more  GLVLSI 2008»
14 years 1 months ago
NBTI-aware flip-flop characterization and design
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...
DATE
2007
IEEE
85views Hardware» more  DATE 2007»
14 years 1 months ago
Low-power warp processor for power efficient high-performance embedded systems
Researchers previously proposed warp processors, a novel architecture capable of transparently optimizing an executing application by dynamically re-implementing critical kernels ...
Roman L. Lysecky
VLSI
2007
Springer
14 years 1 months ago
Incremental placement for structured ASICs using the transportation problem
— While physically driven synthesis techniques have proven to be an effective method to meet tight timing constraints required by a design, the incremental placement step during ...
Andrew C. Ling, Deshanand P. Singh, Stephen Dean B...
DFT
2003
IEEE
98views VLSI» more  DFT 2003»
14 years 20 days ago
Constrained ATPG for Broadside Transition Testing
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Xiao Liu, Michael S. Hsiao
ISCAS
1999
IEEE
94views Hardware» more  ISCAS 1999»
13 years 11 months ago
Lower bounds on energy dissipation and noise-tolerance for deep submicron VLSI
In this paper, we obtain the lower bounds on total energy dissipation of deep submicron (DSM) VLSI circuits via an informationtheoretic framework. This framework enables the deriv...
Rajamohana Hegde, Naresh R. Shanbhag