Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakr...
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
Popular code coverage measures, such as branch coverage, are indicators of the thoroughness rather than the fault detection capability of test suites. Mutation testing is a fault-...
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...