Sciweavers

19 search results - page 2 / 4
» Effective Error Diagnosis for RTL Designs in HDLs
Sort
View
DATE
2009
IEEE
178views Hardware» more  DATE 2009»
14 years 1 months ago
Correct-by-construction generation of device drivers based on RTL testbenches
Abstract—The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, ev...
Nicola Bombieri, Franco Fummi, Graziano Pravadelli...
DATE
2007
IEEE
123views Hardware» more  DATE 2007»
14 years 1 months ago
Clock domain crossing fault model and coverage metric for validation of SoC design
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
Yi Feng 0002, Zheng Zhou, Dong Tong, Xu Cheng
GLVLSI
2008
IEEE
150views VLSI» more  GLVLSI 2008»
13 years 7 months ago
Using unsatisfiable cores to debug multiple design errors
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...
André Sülflow, Görschwin Fey, Rod...
DAC
2010
ACM
13 years 10 months ago
Scalable specification mining for verification and diagnosis
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...
Wenchao Li, Alessandro Forin, Sanjit A. Seshia
AUTOMATICA
2007
98views more  AUTOMATICA 2007»
13 years 7 months ago
LMI-based sensor fault diagnosis for nonlinear Lipschitz systems
The problem of sensor fault diagnosis in the class of nonlinear Lipschitz systems is considered. A dynamic observer structure is used with the objective to make the residual conve...
A. M. Pertew, H. J. Marquez, Q. Zhao