303 search results - page 52 / 61 » Efficient Design Error Correction of Digital Circuits |
ASPDAC
2007
ACM
14 years 21 days ago
2007
ACM
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
DAC
2008
ACM
14 years 9 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
SODA
2000
ACM
13 years 10 months ago
2000
ACM
We address the problem of minimizing the communication involved in the exchange of similar documents. We consider two users, A and B, who hold documents x and y respectively. Neit...
IPSN
2010
Springer
13 years 10 months ago
2010
Springer
In-network processing is recommended for many sensor network applications to reduce communication and improve energy efficiency. However, constraints on memory, speed, and energy ...