49 search results - page 4 / 10 » Efficient Space Time Compression to Reduce Test Data Volume ... |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
VMV
2001
13 years 8 months ago
2001
In many applications surfaces containing a large number of primitives occur. Geometry compression reduces storage space and transmission time for such models. A special case is gi...
ITC
2002
IEEE
14 years 11 days ago
2002
IEEE
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...