49 search results - page 5 / 10 » Efficient Space Time Compression to Reduce Test Data Volume ... |
VTS
2003
IEEE
14 years 22 days ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
ICCD
1999
IEEE
13 years 11 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
ADBIS
2007
Springer
14 years 1 months ago
2007
Springer
This paper describes a new XML compression scheme that offers both high compression ratios and short query response time. Its core is a fully reversible transform featuring substit...