2174 search results - page 15 / 435 » Efficient Testing of Forecasts |
ADBIS
2009
Springer
14 years 1 months ago
2009
Springer
Data classification is usually based on measurements recorded at the same time. This paper considers temporal data classification where the input is a temporal database that descri...
TVLSI
2010
13 years 4 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ATS
2000
IEEE
14 years 2 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
ACL
2010
13 years 7 months ago
2010
We argue that groups of unannotated texts with overlapping and non-contradictory semantics represent a valuable source of information for learning semantic representations. A simp...
EUSFLAT
2009
13 years 7 months ago
2009
This article deals with the recognition of recurring multivariate time series patterns modelled sample-point-wise by parametric fuzzy sets. An efficient classification-based approa...