Non-determinism of the thread schedule is a well-known problem in concurrent programming. However, other sources of non-determinism exist which cannot be controlled by an applicati...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
A model-based approach for minimization of test sets for interactive systems is introduced. Test cases are efficiently generated and selected to cover the behavioral model and the ...
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
Specification-based testing is a particular case of black-box testing, which consists in deriving test cases from an analysis of a formal specification. We present in this paper an...