2174 search results - page 62 / 435 » Efficient Testing of Forecasts |
ETS
2009
IEEE
13 years 7 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
ICCAD
2009
IEEE
13 years 7 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
ISPW
2009
IEEE
14 years 4 months ago
2009
IEEE
For a software project to succeed, acceptable quality must be achieved within an acceptable cost, providing business value to the customers, and keeping delivery time short. Softwa...
DSD
2006
IEEE
14 years 4 months ago
2006
IEEE
Testing of high density SoCs operating at high clock speeds is an important but difficult problem. Many faults, like delay faults, in such sub-micron chips may only appear when th...
ICSEA
2006
IEEE
14 years 4 months ago
2006
IEEE
—The XML language is becoming the preferred means of data interchange and representation in web based applications. Usually, XML data is stored in XML repositories, which can be ...