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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
14 years 1 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
MICRO
2000
IEEE
137views Hardware» more  MICRO 2000»
13 years 11 months ago
Relational profiling: enabling thread-level parallelism in virtual machines
Virtual machine service threads can perform many tasks in parallel with program execution such as garbage collection, dynamic compilation, and profile collection and analysis. Har...
Timothy H. Heil, James E. Smith
CCS
2008
ACM
13 years 9 months ago
Efficiently tracking application interactions using lightweight virtualization
In this paper, we propose a general-purpose framework that harnesses the power of lightweight virtualization to track applications interactions in a scalable an efficient manner. ...
Yih Huang, Angelos Stavrou, Anup K. Ghosh, Sushil ...
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 7 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
OSDI
1996
ACM
13 years 8 months ago
Microkernels Meet Recursive Virtual Machines
This paper describes a novel approach to providingmodular and extensible operating system functionality and encapsulated environments based on a synthesis of microkernel and virtu...
Bryan Ford, Mike Hibler, Jay Lepreau, Patrick Tull...