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DAC
2002
ACM
14 years 11 months ago
2002
ACM
ERSA
2007
13 years 11 months ago
2007
- Two fault isolation approaches based on Combinatorial Group Testing (CGT) are presented. Although they both share the basic principle of grouping suspect resources into subgroups...
FCT
2009
Springer
14 years 4 months ago
2009
Springer
Suppose that we are given a set of n elements d of which are “defective”. A group test can check for any subset, called a pool, whether it contains a defective. It is well know...
DM
2008
13 years 10 months ago
2008
Motivated from an application to DNA library screening, Balding and Torney [1] and Colbourn [4] studied the following group testing for consecutive positives. Suppose Vn = {v1 v2 ...
DAC
1994
ACM
14 years 2 months ago
1994
ACM
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...