Enhancing test efficiency for delay fault testing using multiple-clocked schemes

15 years 16 days ago

Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jenni

DAC 2002 | Delay Fault Testing | Design Automation |

claim paper

Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	2002
Where	DAC
Authors	Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams

Comments (0)