4192 search results - page 29 / 839 » Efficient testing of groups |
TVLSI
2010
13 years 4 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ATS
2000
IEEE
14 years 2 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
ICCV
2011
IEEE
12 years 10 months ago
2011
IEEE
We present a generic, efficient and iterative algorithm for interactively clustering classes of images and videos. The approach moves away from the use of large hand labelled tra...
CHI
2006
ACM
14 years 10 months ago
2006
ACM
As our business, academic, and personal lives continue to move at an ever-faster pace, finding times for busy people to meet has become an art. One of the most perplexing challeng...
ATS
2002
IEEE
14 years 3 months ago
2002
IEEE
Test planning for core-based system-on-a-chip (SOC) designs is necessary to reduce testing time and test cost. In this paper, we survey recent advances in test planning that addre...