257 search results - page 17 / 52 » Electronic circuit reliability modeling |
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
ASPDAC
2000
ACM
14 years 2 months ago
2000
ACM
- This paper presents a new aged timing simulation methodology that can be used for hot-carrier reliability assurance of VLSI. This methodology consists of a compact model and a un...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Abstract— Chip-package thermal analysis is necessary for the design and synthesis of reliable, high-performance, low-power, compact integrated circuits (ICs). Many methods of IC ...
FPGA
2010
ACM
13 years 7 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
BROADNETS
2006
IEEE
14 years 1 months ago
2006
IEEE
Traffic grooming continues to be a rich area of research in the context of WDM optical networks. We provide an overview of the optical and electronic grooming techniques available...