257 search results - page 20 / 52 » Electronic circuit reliability modeling |
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
ICCAD
1994
IEEE
14 years 2 months ago
1994
IEEE
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
DAC
2003
ACM
14 years 3 months ago
2003
ACM
Reduction of an extracted netlist is an important pre-processing step for techniques such as model order reduction in the design and analysis of VLSI circuits. This paper describe...
WWW
2009
ACM
14 years 10 months ago
2009
ACM
In the last decade, there has been an explosion of online commercial activity enabled by the World Wide Web. An electronic marketplace (e-market) provides an online method to perf...