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DAC
2008
ACM
14 years 8 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2004
ACM
14 years 8 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw
SAC
2003
ACM
14 years 19 days ago
iGrocer- A Ubiquitous and Pervasive Smart Grocery Shopping System
Emerging Smart phones are poised to give a whole new dimension to the way we shop, bank, and go about many of our everyday activities. iGrocer is a smart grocery shopping assistant...
Sangeetha Shekar, Prashant Nair, Abdelsalam Helal
SAC
2008
ACM
13 years 6 months ago
Model-driven development of component-based adaptive distributed applications
This paper introduces an approach to develop componentbased adaptive distributed applications. Our approach separates the communication and the functional aspects of a distributed...
An Phung-Khac, Antoine Beugnard, Jean-Marie Gillio...
ICML
1998
IEEE
14 years 8 months ago
Bayesian Network Classification with Continuous Attributes: Getting the Best of Both Discretization and Parametric Fitting
In a recent paper, Friedman, Geiger, and Goldszmidt [8] introduced a classifier based on Bayesian networks, called Tree Augmented Naive Bayes (TAN), that outperforms naive Bayes a...
Moisés Goldszmidt, Nir Friedman, Thomas J. ...